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Structural, Syntactic, and Statistical Pattern Recognition: Joint IAPR International Workshop, S+SSPR 2018, Beijing, China, August 17–19, 2018, Proceedings
Edited by Xiao Bai, Edited by Edwin R. Hancock, Edited by Tin Kam Ho, Edited by Richard C. Wilson, Edited by Battista Biggio, Edited by Antonio Robles-Kelly
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normal price: R 2 192.95
Price: R 2 083.95
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| book description |
This book constitutes the proceedings of the Joint IAPR International Workshop on Structural, Syntactic, and Statistical Pattern Recognition, S+SSPR 2018, held in Beijing, China, in August 2018. The 49 papers presented in this volume were carefully reviewed and selected from 75 submissions. They were organized in topical sections named: classification and clustering; deep learning and neurla networks; dissimilarity representations and Gaussian processes; semi and fully supervised learning methods; spatio-temporal pattern recognition and shape analysis; structural matching; multimedia analysis and understanding; and graph-theoretic methods.Â
| product details |
Normally shipped |
Publisher | Springer International Publishing AG
Published date | 2 Aug 2018
Language |
Format | Paperback / softback
Pages | 524
Dimensions | 235 x 155 x 0mm (L x W x H)
Weight | 0g
ISBN | 978-3-3199-7784-3
Readership Age |
BISAC | computers / artificial intelligence
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