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VLSI-SoC: Design for Reliability, Security, and Low Power: 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, Daejeon, Korea, October 5-7, 2015, Revised Selected Papers
Edited by Youngsoo Shin, Edited by Chi Ying Tsui, Edited by Jae-Joon Kim, Edited by Kiyoung Choi, Edited by Ricardo Reis
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normal price: R 1 707.95
Price: R 1 536.95
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| book description |
This book contains extended and revised versions of the best papers presented at the 23rd IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2015, held in Daejeon, Korea, in October 2015. The 10 papers included in the book were carefully reviewed and selected from the 44 full papers presented at the conference. The papers cover a wide range of topics in VLSI technology and advanced research. They address the current trend toward increasing chip integration and technology process advancements bringing about new challenges both at the physical and system-design levels, as well as in the test of these systems.
| product details |

Normally shipped |
Publisher | Springer International Publishing AG
Published date | 22 Apr 2018
Language |
Format | Paperback / softback
Pages | 223
Dimensions | 235 x 155 x 0mm (L x W x H)
Weight | 0g
ISBN | 978-3-3198-3440-5
Readership Age |
BISAC | computers / hardware / general
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