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books
| book details |
Scan Statistics
By (author) Joseph Glaz, By (author) Joseph Naus, By (author) Sylvan Wallenstein
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normal price: R 3 462.95
Price: R 3 289.95
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| book description |
In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.
| product details |

Normally shipped |
Publisher | Springer-Verlag New York Inc.
Published date | 6 Dec 2010
Language |
Format | Paperback / softback
Pages | 372
Dimensions | 235 x 155 x 0mm (L x W x H)
Weight | 0g
ISBN | 978-1-4419-3167-2
Readership Age |
BISAC | mathematics / probability & statistics / general
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Normally shipped |
Readership Age |
Normal Price | R 4 386.95
Price | R 4 166.95
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