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Multi-Chip Module Test Strategies

Edited by Yervant Zorian

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normal price: R 4 229.95

Price: R 3 806.95

| book description |

MCMs today consist of complex and dense VLSI devices mounted into packages that allow little physical access to internal nodes. The complexity and cost associated with their test and diagnosis are major obstacles to their use. Multi-Chip Module Test Strategies presents state-of-the-art test strategies for MCMs. This volume of original research is designed for engineers interested in practical implementations of MCM test solutions and for designers looking for leading edge test and design-for-testability solutions for their next designs. Multi-Chip Module Test Strategies consists of eight contributions by leading researchers. It is designed to provide a comprehensive and well-balanced coverage of the MCM test domain. Multi-Chip Module Test Strategies has also been published as a special issue of the Journal of Electronic Testing: Theory and Applications (JETTA, Volume 10, Numbers 1 and 2).

| product details |



Normally shipped | Available from overseas. Usually dispatched in 14 days
Publisher | Kluwer Academic Publishers
Published date | 31 May 1997
Language |
Format | Hardback
Pages | 167
Dimensions | 254 x 203 x 0mm (L x W x H)
Weight | 0g
ISBN | 978-0-7923-9920-9
Readership Age |
BISAC |

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