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books
| book details |
Characterization, Testing, Measurement, and Metrology
Edited by Chander Prakash, Edited by Sunpreet Singh, Edited by J. Paulo Davim
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| on special |
normal price: R 2 948.95
Price: R 2 801.95
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| book description |
This book presents the broad aspects of measurement, performanceanalysis, and characterization for materials and devices through advanced manufacturing processes. The field of measurement and metrology as a precondition for maintaining high-quality products, devices, and systems in materials and advanced manufacturing process applications has grown substantially in recent years. The focus of this book is to present smart materials in numerous technological sectors such as automotive, bio-manufacturing, chemical, electronics, energy, and construction. Advanced materials have novel properties and therefore must be fully characterized and studied in-depth so they can be incorporated into products that will outperform existing products and resolve current problems. The book captures the emerging areas of materials science and advanced manufacturing engineering and presents recent trends in research for researchers, field engineers, and academic professionals.
| product details |
Normally shipped |
Publisher | Taylor & Francis Ltd
Published date | 4 Oct 2024
Language |
Format | Paperback / softback
Pages | 192
Dimensions | 234 x 156 x 0mm (L x W x H)
Weight | 299g
ISBN | 978-0-3675-5494-1
Readership Age |
BISAC | technology / material science
| other options |
Normally shipped |
Readership Age |
Normal Price | R 3 460.95
Price | R 3 287.95
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